Future Technologies Conference 2023

San Francisco, CA

November 2 – 3, 2023

Join us at FTC 2023

Future Technologies Conference is the world’s pre-eminent forum for reporting research breakthroughs in Artificial Intelligence, Computer Vision, Data Science, Computing, Ambient Intelligence and related fields.

Discover, learn, network, and connect!

The Future Technologies Conference presents the best of current systems research and practice, emphasizing innovation and quantified experience. FTC has emerged as the foremost world-wide gathering of academic researchers, Ph.D. and graduate students, top research think tanks and industry technology developers.

Flavio Villanustre, SVP, Technology and CISO for LexisNexis Risk Solutions, will be a keynote speaker and Narayan Kandel, one of our HPCC Systems interns this year, will be presenting. Be sure to stop by our HPCC Systems booth to learn more about the platform, academic research and student opportunities!

About our speakers:
Flavio Villanustre is a seasoned technology executive, data science expert, and cybersecurity specialist. A trained MD and Neurosurgeon, he has dedicated his professional life to Computer Engineering and Computer Science, with over three decades of experience leading transformative technology projects. Flavio’s interest in emerging technologies has driven him to novel fields such as Artificial Intelligence, Blockchain and Quantum Computing, which led him to his successful participation in the 2020 IBM Qiskit challenge. He is a vocal advocate for open-source initiatives, a sought-after speaker, and a visionary leader driving innovation at the intersection of quantum computing, data science, and cybersecurity.

Narayan Kandel is in his third year of pursuing a Ph.D. in Computer Science at School of Computing at Clemson University. His research focuses on the convergence of Artificial Intelligence, Computer Vision, and Computer Graphics. Specifically, Narayan is dedicated to investigating efficient neural network-based methods for representing material reflectance properties.